
QIII SM™
QIII SM™ – Surface Particle Detector (0.3-10µm)
Redefine Productivity with Advanced Particle Detection
The QIII SM™ by Pentagon Technologies is an industry-standard surface particle detector, designed for high-tech industries that require precise measurement and control of surface contamination.
Microscopic particles that accumulate on critical surfaces can significantly impact product yield and reliability. To maintain optimal performance in particle-sensitive manufacturing, it is essential to have quantifiable contamination metrics.
The QIII Surface Metric – QIII SM™ utilizes an advanced, patented interface to dislodge and capture surface particles, allowing for immediate detection and analysis. With the QIII SM™, businesses can efficiently identify and eliminate harmful particles, reducing downtime and increasing production efficiency.
Key Benefits of QIII SM™
✔ Instant Surface Particle Measurements – Quickly assess surface cleanliness for real-time quality control.
✔ Enhanced Yield & Reliability – Reduce contamination levels to improve product consistency.
✔ Fast Troubleshooting – Rapidly identify particle sources, minimizing production disruptions.
✔ Monitor & Control Contamination – Set limits for particle density on incoming and outgoing materials.
✔ Continuous Process Improvement – Establish surface cleanliness benchmarks for better long-term quality.
✔ ISO 14644-9 Compliance – Ensures measurement standards for cleanroom classification.
✔ Seamless Data Integration – Compatible with Statistical Process Control (SPC) systems.
✔ BKM Mode – Maintains consistent measurement accuracy.
✔ Advanced Particle Analysis – Capture and examine counted particles using the optional Particle Analysis Module.
✔ 21 CFR Part 11 Compliance – Suitable for life-science applications requiring regulated data integrity.
Technical Specifications
- Particle Sensitivity Range: 0.3µm – 10µm
- Detection Channels: 0.3, 0.5, 1.0, 3.0, 5.0, 10.0µm
- Sensor Type: Laser Diode
- Dimensions & Weight: 12” W × 10.5” D × 9” H, 18.5 lbs
- Battery: (2) Lithium-Ion, hot-swappable
- Display: 7” WVGA sealed touchscreen with pinch-zoom functionality
- Data Units: Particle Density and Raw Counts
- Advanced UI: Data Analysis Mode for averaging surface particle measurements
- Data Output: USB port, Ethernet, optional WiFi
- Included Probe: ½” right-angle probe
- Purge Options: Purge Filter to reset detector counts & Purge Probe Function to reset probe counts
- Self-Cleaning Mode: 50% increased airflow for automatic particle removal
- Power Supply: 100-240 VAC, 50/60 Hz
- Sampling Modes: Static & Dynamic
- Certification: CE Certified
- Supported Languages: English, Chinese, Japanese, Korean
- Manufactured in: USA
Why Choose QIII SM™?
The QIII SM™ sets the benchmark for surface particle detection, offering unmatched precision, reliability, and compliance with industry standards. It is the ideal solution for semiconductor manufacturing, SMT (Surface Mount Technology), life sciences, and high-tech production environments that demand exceptional surface cleanliness.
🚀 Optimize your contamination control with QIII SM™. Contact us today for more information!
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