
QIII SX™
QIII SX™ – Surface Particle Detector (5-125µm)
Enhance Productivity with Advanced Surface Contamination Control
The QIII SX™ by Pentagon Technologies is a cutting-edge surface particle detector, setting the industry standard for measuring and controlling surface contamination in high-tech manufacturing.
Particles smaller than 100µm are nearly invisible to the naked eye. These microscopic contaminants settle quickly and often go undetected in routine air monitoring. QIII SX™ effectively measures particles ranging from 5µm to 125µm, detecting both sub-visible and visible particles that impact production quality.
With QIII SX™, manufacturers can quickly identify and eliminate contamination, reducing downtime and improving operational efficiency.
Key Benefits of QIII SX™
✔ Instant Surface Particle Detection – Provides real-time surface cleanliness assessment.
✔ Improved Yield & Product Reliability – Reduces contamination to enhance product consistency.
✔ Fast Troubleshooting – Identifies contamination sources quickly, minimizing production delays.
✔ Advanced Contamination Control – Monitors and sets thresholds for surface particle density on incoming and outgoing materials.
✔ Continuous Process Improvement – Establishes a baseline for long-term surface cleanliness management.
✔ ISO 14644-9 Compliance – Ensures adherence to international cleanliness classification standards.
✔ Seamless SPC Integration – Compatible with Statistical Process Control (SPC) systems.
✔ BKM Mode – Ensures consistency and accuracy in measurements.
✔ Optional Particle Analysis Module – Captures and analyzes counted particles for in-depth contamination assessment.
✔ 21 CFR Part 11 Compliance – Suitable for life science applications requiring strict regulatory adherence.
Technical Specifications
- Particle Sensitivity Range: 5µm – 125µm
- Detection Channels: 5, 10, 25, 50, 100, 125µm
- Sensor Type: Laser Diode
- Dimensions & Weight: 12” W × 10.5” D × 9” H, 18.5 lbs
- Battery: (2) Lithium-Ion, hot-swappable
- Display: 7” WVGA sealed touchscreen with pinch-zoom functionality
- Data Units: Particle Density and Raw Counts
- Advanced UI: Data Analysis Mode for averaging surface particle measurements
- Data Output: USB port, Ethernet, optional WiFi
- Included Probe: ½” right-angle probe
- Purge Options: Purge Filter for resetting detector counts & Purge Probe Function to reset probe counts
- Self-Cleaning Mode: 50% increased airflow for automatic particle removal
- Power Supply: 100-240 VAC, 50/60 Hz
- Sampling Modes: Static & Dynamic
- Certification: CE Certified
- Supported Languages: English, Chinese, Japanese, Korean
- Manufactured in: USA
Why Choose QIII SX™?
QIII SX™ provides superior surface contamination detection, helping businesses optimize production quality, reduce rework, and increase overall efficiency.
With its advanced detection technology, QIII SX™ is the perfect solution for industries requiring exceptional surface cleanliness, such as semiconductor manufacturing, SMT (Surface Mount Technology), life sciences, and high-tech industrial production.
🚀 Optimize contamination control with QIII SX™. Contact us today for more details!
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