QIII SX™ – Surface Particle Detector (5-125µm)

QIII SX™

icon-lich.svg February 5, 2025

QIII SX™ – Surface Particle Detector (5-125µm)

Enhance Productivity with Advanced Surface Contamination Control

The QIII SX™ by Pentagon Technologies is a cutting-edge surface particle detector, setting the industry standard for measuring and controlling surface contamination in high-tech manufacturing.

Particles smaller than 100µm are nearly invisible to the naked eye. These microscopic contaminants settle quickly and often go undetected in routine air monitoring. QIII SX™ effectively measures particles ranging from 5µm to 125µm, detecting both sub-visible and visible particles that impact production quality.

With QIII SX™, manufacturers can quickly identify and eliminate contamination, reducing downtime and improving operational efficiency.


Key Benefits of QIII SX™

Instant Surface Particle Detection – Provides real-time surface cleanliness assessment.
Improved Yield & Product Reliability – Reduces contamination to enhance product consistency.
Fast Troubleshooting – Identifies contamination sources quickly, minimizing production delays.
Advanced Contamination Control – Monitors and sets thresholds for surface particle density on incoming and outgoing materials.
Continuous Process Improvement – Establishes a baseline for long-term surface cleanliness management.
ISO 14644-9 Compliance – Ensures adherence to international cleanliness classification standards.
Seamless SPC Integration – Compatible with Statistical Process Control (SPC) systems.
BKM Mode – Ensures consistency and accuracy in measurements.
Optional Particle Analysis Module – Captures and analyzes counted particles for in-depth contamination assessment.
21 CFR Part 11 Compliance – Suitable for life science applications requiring strict regulatory adherence.


Technical Specifications

  • Particle Sensitivity Range: 5µm – 125µm
  • Detection Channels: 5, 10, 25, 50, 100, 125µm
  • Sensor Type: Laser Diode
  • Dimensions & Weight: 12” W × 10.5” D × 9” H, 18.5 lbs
  • Battery: (2) Lithium-Ion, hot-swappable
  • Display: 7” WVGA sealed touchscreen with pinch-zoom functionality
  • Data Units: Particle Density and Raw Counts
  • Advanced UI: Data Analysis Mode for averaging surface particle measurements
  • Data Output: USB port, Ethernet, optional WiFi
  • Included Probe: ½” right-angle probe
  • Purge Options: Purge Filter for resetting detector counts & Purge Probe Function to reset probe counts
  • Self-Cleaning Mode: 50% increased airflow for automatic particle removal
  • Power Supply: 100-240 VAC, 50/60 Hz
  • Sampling Modes: Static & Dynamic
  • Certification: CE Certified
  • Supported Languages: English, Chinese, Japanese, Korean
  • Manufactured in: USA

Why Choose QIII SX™?

QIII SX™ provides superior surface contamination detection, helping businesses optimize production quality, reduce rework, and increase overall efficiency.

With its advanced detection technology, QIII SX™ is the perfect solution for industries requiring exceptional surface cleanliness, such as semiconductor manufacturing, SMT (Surface Mount Technology), life sciences, and high-tech industrial production.

🚀 Optimize contamination control with QIII SX™. Contact us today for more details!


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