
QIII ST™
QIII ST™ – Surface Particle Detector (0.1-5µm)
Maximize Productivity with Advanced Particle Detection
The QIII ST™ by Pentagon Technologies is a cutting-edge surface particle detector, setting the industry standard for measuring and controlling surface contamination in high-tech environments.
Microscopic particles accumulating on critical surfaces can compromise yield and reliability. In particle-sensitive manufacturing, having precise contamination metrics is crucial.
The QIII Surface Technology – QIII ST™ features a patented interface that effectively dislodges and captures surface particles for real-time detection and analysis. Use QIII ST™ to efficiently identify and eliminate particles, reducing costs and improving operational efficiency.
Key Benefits of QIII ST™
✔ Instant Surface Particle Detection – Provides immediate contamination assessment.
✔ Enhanced Yield & Reliability – Reduces surface particles for better product quality.
✔ Efficient Troubleshooting – Quickly locates particle sources, minimizing downtime.
✔ Contamination Control – Monitors and sets limits for particle density on materials.
✔ Continuous Improvement – Establishes a cleanliness benchmark for long-term quality control.
✔ ISO 14644-9 Compliance – Ensures adherence to cleanroom classification standards.
✔ SPC Data Integration – Supports Statistical Process Control (SPC) systems.
✔ BKM Mode – Guarantees consistent and accurate measurements.
✔ Advanced Particle Analysis – Captures and analyzes counted particles using the optional Particle Analysis Module.
✔ 21 CFR Part 11 Compliance – Suitable for life-science applications requiring regulatory compliance.
Technical Specifications
- Particle Sensitivity Range: 0.1µm – 5µm
- Detection Channels: 0.1, 0.2, 0.3, 1.0, 3.0, 5.0µm
- Sensor Type: Laser Diode
- Dimensions & Weight: 12” W × 12” D × 9” H, 26.5 lbs
- Battery: (2) Lithium-Ion, hot-swappable
- Display: 7” WVGA sealed touchscreen with pinch-zoom functionality
- Data Units: Particle Density and Raw Counts
- Advanced UI: Data Analysis Mode for averaging surface particle measurements
- Data Output: USB port, Ethernet, optional WiFi
- Included Probe: ½” right-angle probe
- Purge Options: Purge Filter to reset detector counts & Purge Probe Function to reset probe counts
- Self-Cleaning Mode: 50% increased airflow for automatic particle removal
- Power Supply: 100-240 VAC, 50/60 Hz
- Sampling Modes: Static & Dynamic
- Certification: CE Certified
- Supported Languages: English, Chinese, Japanese, Korean
- Manufactured in: USA
Why Choose QIII ST™?
With QIII ST™, businesses can achieve superior contamination control, enhancing production efficiency while reducing defects and downtime. It is an ideal solution for industries demanding high surface cleanliness, such as semiconductor manufacturing, SMT (Surface Mount Technology), and life sciences.
Optimize contamination control with QIII ST™. Contact us today for more details!
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